Yale Patt Recognized with Four Papers Among Inaugural Micro Test of Time Award Winners
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چکیده
Yale N. Patt [2], professor in the Department of Electrical and Computer Engineering at The University of Texas at Austin's Cockrell School of Engineering [3], has been recognized for his tremendous body of work in microarchitecture with four papers co-authored by he and his students selected as part of the ten award winners of the inaugural Micro Test of Time Award in 2014. The Micro Test of Time (ToT) Award recognizes the most influential papers published in past Micro conferences that have had significant impact in the field.
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تاریخ انتشار 2017